xHREMTM: HREM Simulation Suite
New Version (v4.5) is available now!
xHREMTM (WinHREMTM/MacHREMTM) is a suite of the high-resolution electron microscope (HREM) simulation programs that will run under both Windows and Max OS. This emerges from the HREM image simulation programs based on FFT multislice technique developed at Arizona State University, USA. This is one of the most reliable and efficient HREM image simulation programs in the world. Computing speed is optimized by using Intel’s Math Kernal Library (MKL).
xHREMTM has been developed for the image simulation for Transmission Electron Microscope (TEM) and enforced by two options used to simulate Convergent Beam Electron Diffraction (CBED) and Scanning Transmission Electron Microscope (STEM), respectively. Please consult each catalog listed below for more information.
xHREM supports a multi-CPU machine and provides 64-bit versions. Furthermore, 32- and 64-bit cluster versions for STEM Extenstion are avairable.
Furthermore, a computation time of STEM image simulation can be reduced to 1/20 compared with the versions before v3.6 using an efficient interpolation method. Thus, one day calculation in the past can be done just within one hour. We recommend to use this version especially for a STEM simulation.
This version has a user interface to handle a non-periodic (non-crystal) model.
- xHREM (FFT-Multislice Simulation Suite)
Manual (PDF format)
- xHREM: Image Simulation Program
- STEM Extension: STEM Image Simulation
- CBED Extension: Coherent CBED Simulation
- Q and A
References and Technical Notes
- K. Ishizuka and N. Uyeda: A New Theoretical and Practical Approach to the Multislice Method, Acta Cryst. A33 (1977) 740.
- K. Ishizuka: Contrast Transfer of Crystal Images in TEM, Ultramicroscopy 5 (1980) 55.
- K. Ishizuka: A practical approach for STEM image simulation based on the FFT multislice method, Ultramicroscopy 90 (2002) 71-83.
- K. Ishizuka: Multislice Formula for Inclined Illumination, Acta Cryst. A38 (1982) 773-779.
- K. Ishizuka: Prospects of atomic resolution imaging with an aberration-corrected STEM, J. Electron Microsc. 50 (2001) 291-305.
Commercial Programs (Licensed Programs)
You have to purchase a license (hardware key) to run this program.
Please send your price enquiry to email@example.com.
- HREM Simulation Suite (32bit/64bit) v4.5.0 Windows MacOS
(xHREM, CBED Extenstion and STEM Extenstion)
- STEM Extension Cluster (STEM Extenstion Cluster 32/64bit version)
A separate license is required for each node PC.
- User Key Driver / Remote Update System (RUS)
User key is required for commercial programs
- xHREM at v3.6 (Oct. 2011): see the details
- STEM Extension at v4.4 (Nov. 2018): Second annular detector.
You can calculate at the same time two images from annular detectors, such as HAADF and ABF images, or HAADF and LAADF images.
- STEM Extension at v4.5 (Sept. 2020): DPC signal simulation
Differential Phase Contrast (DPC) signal can be simulated with this version. The DPC signal can be integrated to give a phase distribution by using the qDPC plug-in for DigitalMicroscope.
STEM-DPC bata for Windows
From xHREM v3.6 a HASP HL (SRM) key is required. The users who are using a HASP4 key or an old HASP HL key need to upgrade their key to a new HASP HL (SRM) key.
Please contact to firstname.lastname@example.org for the cost to upgrade your key.