The Jitterbug plug-in for Digital Micrograph identifies and compensates for the common problem of image scan-noise and drift in the STEM. This method can retrieve image resolution lost to instabilities and improve SNR. Crystal lattice angles and lengths are restored to their correct values improving image matching to simulation. The plug-in includes the tools necessary to quantify image resolution and SNR before and after processing allowing the user to quantify the performance improvements they can achieve.
References and Technical Notes(* Basic Readings)
- * L. Jones: Scan-noise and Drift Correction in the STEM, Microscopy Today (2014) p.40-41
- * L. Jones and P. D. Nellist: Identifying and Correcting Scan Noise and Drift in the Scanning Transmission Electron Microscope, Microscopy & Microanalysis 19 (2013), p.1050-1060.
Examples (Sample Data)
Download
You have to purchase a license (hardware key) to run this program.
Please send your price enquiry to support@hremresearch.com.
- Jitterbug v3.7
for GMS 3.6 (64bit)
for GMS 3.5 (64bit)
for GMS 3.4 (64bit)
for GMS 3.3 (64bit) (applicable from GMS 3.0)
for GMS 2.3 32bit GMS 2.3 64bit
for GMS 2.1 32bit GMS 2.1 64bit (applicable from GMS 2.0)
Required plug-ins.
User Key Driver
Previous versions
- Jitterbug v3.6
for GMS 3.5 (64bit)
for GMS 3.4 (64bit)
for GMS 3.3 (64bit) (applicable from GMS 3.0)
for GMS 2.3 32bit GMS 2.3 64bit
for GMS 2.1 32bit GMS 2.1 64bit (applicable from GMS 2.0)
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