Multivariate Statistical Analysis (MSA) is a DigitalMicrograph plug-in based on the program developed by Masashi Watanabe.
MSA for Gatan DigitalMicrograph finds statistically significant features from 2D and 3D spectrum images gathered by spectrometric techniques such as XEDS, EELS, EFTEM and cathodoluminescence.
References and Technical Notes (*Basic Readings)
- * M. Watanabe, E. Okunishi and K. Ishizuka, Analysis of Spectrum-Imaging Datasets in Atomic-Resolution Electron Microscopy, Microscopy and Analysis 23, November 2009
- * K. Ishizuka and M. Watanabe Local PCA: How to Avoid Unexpected Artifacts from Multivariate Statistical Analysis on STEM Spectrum-Imaging Datasets (Presented at IMC2014 at Prague) (PDF)
- M. Watanabe, D.B. Williams and M.G. Burke, Atomic-Level Analytical Electron Microscopy of Diffusional Phase, in Proc. Inter. Conf. on Solid-Solid Phase Transformations in Inorganic Materials 2005 – Vol. 2, pp. 431-442 (2005)
- M. Watanabe, M. Kanno, D.W. Ackland, C.J. Kiely and D.B. Williams, Applications of Electron Energy-Loss Spectrometry and Energy Filtering in an Aberration-Corrected JEM- 2200FS STEM/TEM, Microscopy and Microanalysis, 13 (2007), Suppl. 2, 1264-1265
- M.G. Burke, M. Watanabe, D.B. Williams and J.M. Hyde, Quantitative characterization of nanoprecipitates in irradiated low alloy steels: advances in the application of FEG-STEM quantitative analysis to real materials, J. Mater. Sci. 41(2006), 4512-4522
Examples (Sample Data)
Download
You have to purchase a license (hardware key) to run this program.
Please send your price enquiry to support@hremresearch.com.
- MSA v2.3
for GMS 3.5 (64bit)
for GMS 3.4 (64bit)
for GMS 3.3 (64bit) (applicable from GMS 3.0)
for GMS 2.3 32bit GMS 2.3 64bit
for GMS 2.1 32bit GMS 2.1 64bit (applicable from GMS 2.0)
for GMS 1.x (32bit)
Required plug-ins.
User Key Driver
Previous versions
- MSA v2.2
for GMS 3.3 (64bit) (applicable from GMS 3.0)
for GMS 2.3 32bit GMS 2.3 64bit
for GMS 2.1 32bit GMS 2.1 64bit (applicable from GMS 2.0)
for GMS 1.x (32bit)
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