Strain is one of the important factors in materials design. Using electron microscopy, you can determine the two-dimensional strain down to atomic level. We are providing a variety of methods to determine the strain.

  • GPA (Geometric Phase Analysis)
    The GPA generates the strain maps from high-resolution (S)TEM images based on geometric phase analysis that uses Fourier transform.

  • PPA (Peak-pairs Analysis)
    The PPA calculates strain from the peak positions on high-resolution (S)TEM images. From the peak positions in real space, you can analyze also the distortion of the structure.

  • HoloDark (Dark-field Holography)
    The HoloDark generates the strain maps from dark-field electron holograms based on the GPA technique (see GPA). This will give the strain map over wide field of view with high accuracy compared with the techniques based on HREM images.

  • sMoiré (STEM Moiré Analysis)
    The sMoiré generates the strain maps from Moiré images obtained by STEM using the GPA technique (see GPA). This will give the strain map over wide field of view with high accuracy compared with the techniques based on HR-STEM images.