GPA generates fully quantitative deformation and two-dimensionalstrain maps from standard high-resolution (S)TEM images. GPA is based on geometric phase analysis originally developed by Martin Hytch. GPA is a complementary plug-in to Peak Pairs Analysis (see PPA plug-in), which is another strain measurement plug-in based on the atomic-column positions in HR-(S)TEM images.
Using the GPA technique, we have developed two alternative plug-ins that can be applicable to a wider field of view with higher accuracy: one is based on STEM Moire technique (see sMoire plug-in), and the other uses dark-field Holography (see HoloDark plug-in).
References and Technical Notes (*Basic Readings)
- *M.J. Hytch, E. Snoeck and R. Kilaas, Ultramicroscopy 74 (1998) 131-146. Quantitative measurement of displacement and strain fields from HREM micrographs
- *C. L. Johnson, M. J. Hytch, P. R. Buseck, PNAS 101 (2004) 17936-17939. Nanoscale waviness of low-angle grain boundaries
- M. J. Hytch, J-L. Putaux, J-M. Penisson, Nature 423 (2003) 270-273. Measurement of the displacement field around dislocations to 0.03A by electron microscopy
Examples (Sample Data)
Download
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Please send your price enquiry to support@hremresearch.com.
- GPA Phase v4.12.1
for GMS 3.6 (64bit)
for GMS 3.5 (64bit)
for GMS 3.4 (64bit)
for GMS 3.3 (64bit) (applicable from GMS 3.0)
for GMS 2.3 32bit GMS 2.3 64bit
for GMS 2.1 32bit GMS 2.1 64bit (applicable from GMS 2.0)
Required plug-ins.
User Key Driver
Previous versions
- GPA Phase v4.12
for GMS 3.4 (64bit)
for GMS 3.3 (64bit) (applicable from GMS 3.0)
for GMS 2.3 32bit GMS 2.3 64bit
for GMS 2.1 32bit GMS 2.1 64bit (applicable from GMS 2.0)
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