GPA generates fully quantitative deformation and two-dimensionalstrain maps from standard high-resolution (S)TEM images. GPA is based on geometric phase analysis originally developed by Martin Hytch. GPA is a complementary plug-in to Peak Pairs Analysis (see PPA plug-in), which is another strain measurement plug-in based on the atomic-column positions in HR-(S)TEM images.
Using the GPA technique, we have developed two alternative plug-ins that can be applicable to a wider field of view with higher accuracy: one is based on STEM Moire technique (see sMoire plug-in), and the other uses dark-field Holography (see HoloDark plug-in).
References and Technical Notes (*Basic Readings)
- *M.J. Hytch, E. Snoeck and R. Kilaas, Ultramicroscopy 74 (1998) 131-146. Quantitative measurement of displacement and strain fields from HREM micrographs
- *C. L. Johnson, M. J. Hytch, P. R. Buseck, PNAS 101 (2004) 17936-17939. Nanoscale waviness of low-angle grain boundaries
- M. J. Hytch, J-L. Putaux, J-M. Penisson, Nature 423 (2003) 270-273. Measurement of the displacement field around dislocations to 0.03A by electron microscopy
Examples (Sample Data)
Download
You have to purchase a license (hardware key) to run this program.
Please send your price enquiry to support@hremresearch.com.
- GPA Phase v4.13
for GMS 3.6.2
for GMS 3.6.0 – 3.6.1
for GMS 3.5
for GMS 3.4
for GMS 3.0 – 3.3
for GMS 2.3 64bit
for GMS 2.0 – 2.1 64bit
Required plug-ins.
User Key Driver
Previous versions
- GPA Phase v4.12.1
for GMS 3.6
for GMS 3.5
for GMS 3.4
for GMS 3.0 – 3.3
for GMS 2.3 32bit GMS 2.3 64bit
for GMS 2.0 – 2.1 32bit GMS 2.0 – 2.1 64bit
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