QED (Quantitative Electron Diffraction) controls the electron beam in your TEM to acquire LARBED (Large Angle Rocking Beam Electron Diffraction) and/or PED (Precession Electron Diffraction) patterns.
QED accurately determines specimen thickness, absolute values of structure factors, and specimen surface orientation from LARBED data.
QED is based on the patented technique and routines developed by Christoph Koch.
References and Technical Notes
- * C. T. Koch: Aberration-compensated large-angle rocking beam electron diffraction, Ultramicroscopy, 111 (2011) 828-840
- * C. T. Koch, V. Burak Özdöl and K. Ishizuka: Quantitative Four-Dimensional Electron Diffraction in the TEM, Microscopy and Analysis, May 2012, 5-8.
- C. T. Koch: Method and Device for Measureing Electron Diffraction of a Sample, US patent, US 2011/0049363 A1 (2011)
- C. T. Koch: Many-Beam Solution to the Phase Problem in Crystallography (2008)
Examples (Sample Data)
- LARBED data stack (517 MB)
(data name: Stack_disc_L=290mm_18pts.dm3) - CBED data stack (364 MB)
(data name: CLARBED_15pts_bin4_merged.dm3)
Original data stacks 0 (263 MB) (data name: CLARBED_15pts_bin4_0.dm3)
Original data stacks 1 (110 MB) (data name: CLARBED_15pts_bin4_1.dm3)
Download
You have to purchase a license (hardware key) to run this program.
Please send your price enquiry to support@hremresearch.com.
- QED/Acquisition v1.5.7
for GMS 3.6 (64bit)
for GMS 3.5 (64bit)
for GMS 3.4 (64bit)
for GMS 3.3 (64bit) (applicable from GMS 3.0)
for GMS 2.3 32bit GMS 2.3 64bit
for GMS 2.1 32bit GMS 2.1 64bit (applicable from GMS 2.0)
for GMS 1.x (32bit)
Required plug-ins.
User Key Driver
Previous versions
- QED/Acquisition v1.5.6
for GMS 3.3 (64bit) (applicable from GMS 3.0)
for GMS 2.3 32bit GMS 2.3 64bit
for GMS 2.1 32bit GMS 2.1 64bit (applicable from GMS 2.0)
for GMS 1.x (32bit)
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