QPt provides a digital solution to phase contrast electron microscopy. QPt derives a phase image only from three ordinary bright-field images based on the Transport of Intensity Equation (TIE), and estimate a just-focus (in-focus) image by eliminating artifacts in defocused images. QPt employs Quantitative Phase Imaging (QPI) technology based on Fast Fourier Transform (FFT).

QPt will work for medium resolution electron microscopy, such as microscopic magnetic field observation, as well as atomic resolution electron microscopy. Using the HREM module we can correct spherical aberration from an atomic resolution complex wave function.

Flyer/Specifications

Manual

References and Technical Notes (* Basic Readings)

Examples (Sample Data)

Download

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Please send your price enquiry to support@hremresearch.com.

Required plug-ins.

User Key Driver

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