SmartAlign for DigitalMicrograph

Higashimatsuyama, Saitama, Japan (Sept. 30, 2016): HREM Research Inc. introduced SmartAlign for DigitalMicrograph. The SmartAlign corrects slow instability of probe scanning system (scan distortion) from fast-acquisition multi-frame images using rigid and non-rigid image alignment. Thus, SmartAlign restores resolution before degradation, and improves image quality.

Procedures of SmartAlign have been developed by Lewys Jones and Peter Nellist of University of Oxford [1], and may be well applied for a scanning system, such as a scanning transmission electron microscope (STEM), or scanning tunneling microscope (STM). In these instruments, low frequency instabilities, such as stage drift and scan distortion, change from image to image, and degrade resolution even when we add these images after rigid alignment (simple overall translation alignment). SmartAlign performs non-rigid alignment (pixel level alignment) of each image, and thus restores resolution before degradation. Using the alignment information the other data set obtained at the same time will be aligned. This will be well applied for spectrum image (SI) data obtained with annular dark field (ADF).

[1] L. Jones, et al., “Smart Align a new tool for robust non-rigid registration of scanning microscope data”, Advanced Structural & Chemical Imaging 1:8 (2015) doi:10.1186/s40679-015-0008-4.

(有)HREMは高分解能電子顕微鏡法(HREM)のための有用なソフトウェアの開発を目的として2001年に法人として設立されました。HREMの設立者である石塚博士は高分解能像のシミュレーション法の分野の第一人者です。そして、代表的製品であるMac/WinHREMは高分解能像のシミュレーションソフトウェアとして世界的に高い評判を得ています。現在、HREMは電子顕微鏡の利用者に有用なソフトウェアを鋭意開発中です。さらに詳しい情報はウェブサイトhttp://www.hremresearch.comをご覧下さい。また、support@ hremreserch.comまでお問い合せ下さい。

Kazuo Ishizuka
HREM Research Inc.
14-48 Matsukazedai, Higashimatsuyama
355-0055 JAPAN

Supplementary materials

Single raw STEM ADF image
Image after SmartAlign
Strain map obtained from the aligned image