MSA for DigitalMicrograph

Multivariate Statistical Analysis (MSA) is a DigitalMicrograph plug-in based on the program developed by Masashi Watanabe.
MSA for Gatan DigitalMicrograph finds statistically significant features from 2D and 3D spectrum images gathered by spectrometric techniques such as XEDS, EELS, EFTEM and cathodoluminescence.

Flier/Specifications Manual

References and Technical Notes (* Basic Readings)
  • Kazuo Ishizuka and Masashi Watanabe Local PCA: How to Avoid Unexpected Artifacts from Multivariate Statistical Analysis on STEM Spectrum-Imaging Datasets (Presented at IMC2014 at Prague)
  • * M. Watanabe, E. Okunishi and K. Ishizuka, Analysis of Spectrum-Imaging Datasets in Atomic-Resolution Electron Microscopy, Microscopy and Analysis 23, November 2009 (PDF)
  • M. Watanabe, D.B. Williams and M.G. Burke, Atomic-Level Analytical Electron Microscopy of Diffusional Phase, in Proc. Inter. Conf. on Solid-Solid Phase Transformations in Inorganic Materials 2005 - Vol. 2, pp. 431-442 (2005)
  • M. Watanabe, M. Kanno, D.W. Ackland, C.J. Kiely and D.B. Williams, Applications of Electron Energy-Loss Spectrometry and Energy Filtering in an Aberration-Corrected JEM- 2200FS STEM/TEM, Microscopy and Microanalysis, 13 (2007), Suppl. 2, 1264-1265
  • M.G. Burke, M. Watanabe, D.B. Williams and J.M. Hyde, Quantitative characterization of nanoprecipitates in irradiated low alloy steels: advances in the application of FEG-STEM quantitative analysis to real materials, J. Mater. Sci. 41(2006), 4512-4522
Examples (Sample Data)

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