MSA for DigitalMicrograph
Multivariate Statistical Analysis (MSA) is a DigitalMicrograph plug-in based on the program
developed by Masashi Watanabe.
MSA for Gatan DigitalMicrograph finds statistically significant features from 2D and 3D
spectrum images gathered by spectrometric techniques such as XEDS, EELS, EFTEM and
References and Technical Notes (* Basic Readings)
Examples (Sample Data)
Kazuo Ishizuka and Masashi Watanabe
Local PCA: How to Avoid Unexpected Artifacts from Multivariate Statistical Analysis on STEM Spectrum-Imaging Datasets
(Presented at IMC2014 at Prague)
* M. Watanabe, E. Okunishi and K. Ishizuka, Analysis of Spectrum-Imaging Datasets in
Atomic-Resolution Electron Microscopy, Microscopy and Analysis 23, November 2009 (PDF)
M. Watanabe, D.B. Williams and M.G. Burke, Atomic-Level Analytical Electron Microscopy of
Diffusional Phase, in Proc. Inter. Conf. on Solid-Solid Phase Transformations in Inorganic
Materials 2005 - Vol. 2, pp. 431-442 (2005)
M. Watanabe, M. Kanno, D.W. Ackland, C.J. Kiely and D.B. Williams, Applications of
Electron Energy-Loss Spectrometry and Energy Filtering in an Aberration-Corrected JEM-
2200FS STEM/TEM, Microscopy and Microanalysis, 13 (2007), Suppl. 2, 1264-1265
M.G. Burke, M. Watanabe, D.B. Williams and J.M. Hyde, Quantitative characterization of
nanoprecipitates in irradiated low alloy steels: advances in the application of FEG-STEM
quantitative analysis to real materials, J. Mater. Sci. 41(2006), 4512-4522
You have to purchase a license (hardware key) to run this program.
Please send your price enquiry to firstname.lastname@example.org.
Please Subscribe to the HREM News to get latest information on this plugin.
Note: If you have already subscribed to the HREM News, please don't subscribe again.
Please send your questions and inquiries to