QED for DigitalMicrograph

QED (Quantitative Electron Diffraction) controls the electron beam in your TEM to acquire LARBED (Large Angle Rocking Beam Electron Diffraction) and/or PED (Precession Electron Diffraction) patterns.
QED accurately determines specimen thickness, absolute values of structure factors, and specimen surface orientation from LARBED data.
QED is based on the patented technique and routines developed by Christoph Koch.

Flier/Specifications Manual
References and Technical Notes Examples (Sample Data) Download

You have to purchase a license (hardware key) to run this program.
Please send your price enquiry to support@hremresearch.com.

Previous version

Please Subscribe to the HREM News to get latest information on this plugin.

Note: If you have already subscribed to the HREM News, please don't subscribe again.

Please send your questions and inquiries to