MSA for DigitalMicrograph

Multivariate Statistical Analysis (MSA) is a DigitalMicrograph plug-in based on the program developed by Masashi Watanabe.
MSA for Gatan DigitalMicrograph finds statistically significant features from 2D and 3D spectrum images gathered by spectrometric techniques such as XEDS, EELS, EFTEM and cathodoluminescence.

Flier/Specifications Manual

References and Technical Notes (* Basic Readings)
  • * M. Watanabe, E. Okunishi and K. Ishizuka, Analysis of Spectrum-Imaging Datasets in Atomic-Resolution Electron Microscopy, Microscopy and Analysis 23, November 2009 (PDF)
  • M. Watanabe, D.B. Williams and M.G. Burke, Atomic-Level Analytical Electron Microscopy of Diffusional Phase, in Proc. Inter. Conf. on Solid-Solid Phase Transformations in Inorganic Materials 2005 - Vol. 2, pp. 431-442 (2005)
  • M. Watanabe, M. Kanno, D.W. Ackland, C.J. Kiely and D.B. Williams, Applications of Electron Energy-Loss Spectrometry and Energy Filtering in an Aberration-Corrected JEM- 2200FS STEM/TEM, Microscopy and Microanalysis, 13 (2007), Suppl. 2, 1264-1265
  • M.G. Burke, M. Watanabe, D.B. Williams and J.M. Hyde, Quantitative characterization of nanoprecipitates in irradiated low alloy steels: advances in the application of FEG-STEM quantitative analysis to real materials, J. Mater. Sci. 41(2006), 4512-4522
Examples (Sample Data)
Download

You need your license (hardware key) to run this program.


Previous version

Please Subscribe to the HREM News to get latest information on this plugin.

Note: If you have already subscribed to the HREM News, please don't subscribe again.

Please send your questions and inquiries to
support@hremresearch.com