sMoiré for DigitalMicrograph
sMoiré (STEM Moiré Analysis) analyzes STEM digital Moiré images using geometric phase technique (see GPA plug-in) and gives a strain map from single STEM Moiré image.
References and Technical Notes
sMoiré generates fully two-dimensional strain maps from two STEM Moiré images using the procedure similar to Dark-Field Holography (see HoloDark plug-in).
For STEM Moiré technique
Akimitsu Ishizuka, Martin Hytch and Kazuo Ishizuka, Microscopy 66 (2017) 217-221: STEM moiré analysis for 2D strain measurements
D. Su and Y. Zhu, Ultramicroscopy 110 (2010) 229-233. Scanning moiré fringe imaging by scanning transmission electron microscopy.
S. Kim, Y. Kondo, K. Lee, G. Byun, J. J. Kim, S. Lee and K. Lee, Applied Physics Letters 102, 161604 (2013). Scanning moiré fringe imaging for quantitative strain mapping in semiconductor devices.
For Geometric Phase Analyais
M. J. Hytch, E. Snoeck, R. Kilaas, Ultramicroscopy 74 (1998) 131 146. Quantitative measurement of displacement and strain fields from HREM micrographs.
GPA for DigitalMicrograph
For Dark Field Holography
M.J. Hytch, F. Houdellier, F. Hüe, and E. Snoeck, Nature 453 (2008) 1086-1089. Nanoscale holographic interferometry for strain measurements in electronic devices.
HoloDark for DigitalMicrograph
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