sMoiré for DigitalMicrograph

sMoiré (STEM Moiré Analysis) analyzes STEM Moiré images using geometric phase analysis (GPA) technique (see GPA plug-in) and gives a fully two-dimensional strain map over a wide field of view with high accuracy.
If you have an experience on electron holography using a bi-prism, you can get a fully two-dimensional strain map over a similar field of view and accuracy using dark-field Holography (see HoloDark plug-in), which is also based on the GPA technique.

Flier/Specifications Manual
References and Technical Notes


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