sMoiré for DigitalMicrograph

sMoiré (STEM Moiré Analysis) analyzes STEM digital Moiré images using geometric phase technique (see GPA plug-in) and gives a strain map from single STEM Moiré image.
sMoiré generates fully two-dimensional strain maps from two STEM Moiré images using the procedure similar to Dark-Field Holography (see HoloDark plug-in).

Flier/Specifications Manual
References and Technical Notes

For STEM Moiré technique

For Geometric Phase Analyais

  • M. J. Hytch, E. Snoeck, R. Kilaas, Ultramicroscopy 74 (1998) 131 146. Quantitative measurement of displacement and strain fields from HREM micrographs.
  • GPA for DigitalMicrograph

For Dark Field Holography

  • M.J. Hytch, F. Houdellier, F. Hüe, and E. Snoeck, Nature 453 (2008) 1086-1089. Nanoscale holographic interferometry for strain measurements in electronic devices.
  • HoloDark for DigitalMicrograph


You have to purchase a license (hardware key) to run this program.
Please send your price enquiry to

Previous versions

Please Subscribe to the HREM News to get latest information on this plugin.

Note: If you have already subscribed to the HREM News, please don't subscribe again.

Please send your questions and inquiries to