sMoiré for DigitalMicrograph
sMoiré (STEM Moiré Analysis) analyzes STEM Moiré images using geometric phase analysis (GPA) technique (see GPA plug-in) and gives a fully two-dimensional strain map over a wide field of view with high accuracy.
If you have an experience on electron holography using a bi-prism, you can get a fully two-dimensional strain map over a similar field of view and accuracy using dark-field Holography (see HoloDark plug-in), which is also based on the GPA technique.
Flier/Specifications
Manual
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References and Technical Notes
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Akimitsu Ishizuka, Martin Hytch and Kazuo Ishizuka, Microscopy 66 (2017) 217-221: STEM moiré analysis for 2D strain measurements
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D. Su and Y. Zhu, Ultramicroscopy 110 (2010) 229-233. Scanning moiré fringe imaging by scanning transmission electron microscopy.
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S. Kim, Y. Kondo, K. Lee, G. Byun, J. J. Kim, S. Lee and K. Lee, Applied Physics Letters 102, 161604 (2013). Scanning moiré fringe imaging for quantitative strain mapping in semiconductor devices.
Download
You have to purchase a license (hardware key) to run this program.
Please send your price enquiry to support@hremresearch.com.
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support@hremresearch.com
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