- Strain Measurement
The class of plug-ins to visualize lattice strain from electron microscope images. Using an electron microscope, two-dimensional strain can be determined at the atomic level.
- Phase Measurement
The class of plug-ins to reproduces the phase of electron waves from electron microscope images at atomic resolution. Phase measurement is particularly advantageous for observing light elements.
- Noise Reduction/Resolution Improvement
The class of noise removal plug-ins specialized for data obtained with an electron microscope. They are effective not only for improving visibility but also as pre-processing for quantitative evaluation.
- Spectroscopy
The class of plug-ins related to spectroscopy for EELS and EDX, including data acquisition and analysis, and S/N improvement.
- Quantitative STEM
STEM is ideal for quantitative electron microscopy. We provide a wide range of plug-ins for STEM imaging, STEM-SI, 4D STEM, and DPC.
- Electron Holography
The plug-ins for electron holography to measure the phase of electron waves and observe phase objects and electric and magnetic fields.
- Electron Diffraction
The plug-ins to collect electron diffraction patterns by controlling the electron beam with software.
- A user-key is required to use Commercial-ware.
- All questions about Commercial-ware may be sent to HREM Research Inc.
- HREM Research Inc. will take no responsibility for any problems caused by Commercial-ware.