GPA for DigitalMicrograph

GPA generates fully quantitative deformation and two-dimensionalstrain maps from standard high-resolution (S)TEM images.
GPA is based on geometric phase analysis originally developed by Martin Hytch.
GPA is a complementary plug-in to Peak Pairs Analysis (see PPA plug-in), which is another strain measurement plug-in bead on the atomic-column positions in HR-(S)TEM images.

Using the GPA technique, we have developed two alternative plug-ins that can be applicable to a wider field of view with higher accuracy: one is based on STEM Moire technique (see sMoire plug-in), and the other uses dark-field Holography (see HoloDark plug-in).

Flier/Specifications Manual
References and Technical Notes
Examples (Sample Data)

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