Coherent Convergent Beam Electron Diffraction Pattern Simulation Program

Application Note:
Multislice Implementation for Inclined Illumination and Convergent-Beam Electron Diffraction (International Symposium on Hybrid Analyses For Functional Nanostructure, Kyoto, 1998)
New electron diffraction method to identify the chirality of enantiomorphic crystals (Acta Cryst. (2003) B59)

	CBED
for MacHREM^TM/ WinHREM^TM
Coherent Convergent Beam Electron Diffraction Pattern Simulation Program
Simulated CBED pattern for Si [111]
This optional function adds the capability for simulating coherent convergent beam electron diffraction (CBED) patterns to the MacHREM^TM /WinHREM^TM program suite. User Friendly Graphical Interface Even a novice user can easily generate his/her data and perform computation. Reliable and Efficient Algorithm Dynamical electron interaction is efficiently estimated by using the FFT multislice technique. High Quality Image Output All images are generated with a standard image format of Windows/Mac OS. Therefore, high quality images can be printed from them, and they can be imported into another application.
Please Contact to: HREM Research Inc. 14-48 Matsukazedai, Higashimatsuyama, 355-0055 JAPAN TEL/FAX 0493-35-3919 email: support@hremresearch.com