New Version (v3.0) is avairable now!
xHREMTM (WinHREMTM/MacHREMTM) is a suite of the high-resolution electron microscope (HREM) simulation programs that will run under both Windows and Max OS. This emerges from the HREM image simulation programs based on FFT multislice technique developed at Arizona State University, USA. This is one of the most reliable and efficient HREM image simulation programs in the world.
xHREMTM has been developed for the image simulation for Transmission Electron Microscope (TEM) and enforced by two options used to simulate Convergent Beam Electron Diffraction (CBED) and Scanning Transmission Electron Microscope (STEM), respectively. Please consult each catalog listed below for more information.
Flier/Specifications
Manual (PDF format)
* You may need a free software Acrobat Reader to read the ducument in the PDF (Portable Document File) format. Acrobat Reader can be downloaded from Adobe www.adobe.com.
References and Technical Notes
- K. Ishizuka and N. Uyeda: A New Theoretical and Practical Approach to the Multislice Method, Acta Cryst. A33 (1977) 740.
- K. Ishizuka: Contrast Transfer of Crystal Images in TEM, Ultramicroscopy 5 (1980) 55.
- K. Ishizuka: A practical approach for STEM image simulation based on the FFT multislice method, Ultramicroscopy 90 (2001) 71-83.
- K. Ishizuka: Multislice Formula for Inclined Illumination, Acta Cryst. A38 (1982) 773-779.
|
Answers to Frequently Asked Questions FAQ on HREM image simulation |
|
Licenced programs and Freewares: for Windows; for Mac OS |
Please send your questions and inquiries to
support@hremresearch.com