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| xHREMTM: HREM Simulation Suite | ||||
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New Version (v3.0) is avairable now! | ||||
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xHREMTM (WinHREMTM/MacHREMTM) is a suite of the high-resolution electron microscope (HREM) simulation programs that will run under both Windows and Max OS. This emerges from the HREM image simulation programs based on FFT multislice technique developed at Arizona State University, USA. This is one of the most reliable and efficient HREM image simulation programs in the world. xHREMTM has been developed for the image simulation for Transmission Electron Microscope (TEM) and enforced by two options used to simulate Convergent Beam Electron Diffraction (CBED) and Scanning Transmission Electron Microscope (STEM), respectively. Please consult each catalog listed below for more information. Flier/Specifications Manual (PDF format) * You may need a free software Acrobat Reader to read the ducument in the PDF (Portable Document File) format. Acrobat Reader can be downloaded from Adobe www.adobe.com. References and Technical Notes
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