HoloDark generates quantitative deformation and strain maps over wide fields of view from a pair of dark-field electron holograms
HoloDark is based on the patented technique and routines developed by Martin Hytch.

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• M.J. Hytch, F. Houdellier, F. Hue, and E. Snoeck, Ultramicroscopy 111 (2011) 1328-1337.
  Dark-field electron holography for the measurement of geometric phase
• M.J. Hytch, F. Houdellier, F. Hue, and E. Snoeck, Nature 453 (2008) 1086-1089.
  Nanoscale holographic interferometry for strain measurements in electronic devices
• F. Hue, M.J. Hytch, F. Houdellier, H. Bender, and A. Claverie, Appl. Phys. Lett. 95, 073103 (2009).
  Strain mapping of tensiley strained silicon transistors with embedded Si_1-yC_y source and drain by dark-field holography.
• M.J. Hytch, F. Houdellier, F. Hue, and E. Snoeck,
  International Patent Application No PCT/FR2008/001302
• F. Hue et al. J. Electron Microscopy 54 (2005) 181-190.
  Calibration of projector lens distortions

• HoloDark Phase v1.2
  GMS 2.x ( 32bit , 64bit )   GMS 1.x
  
  
• User Key Driver / Remote Update System (RUS)



• IPU plug-in (Free Software)
  
• HREM Mouse plug-in (Free Software)
  

• HoloDark Phase v1.1
  GMS 2.x ( 32bit , 64bit )   GMS 1.x
  
• HoloDark Phase v1.0.1
  

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