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GPA for DigitalMicrograph
GPA generates fully quantitative deformation
and strain maps from standard HREM images.
GPA is based on geometric
phase algorithms originally
developed by Martin Hytch
Flier/Specifications
Manual
References and Technical Notes
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M.J. Hytch, E. Snoeck and R. Kilaas, Ultramicroscopy 74 (1998) 131-146.
Quantitative measurement of displacement and strain fields from HREM micrographs
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C. L. Johnson, M. J. Hytch, P. R. Buseck, PNAS 101 (2004) 17936-17939. Nanoscale waviness of low-angle grain boundaries
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M. J. Hytch, J-L. Putaux, J-M. Penisson, Nature 423 (2003) 270-273. Measurement of the displacement field around dislocations to 0.03A by electron microscopy
Examples (Sample Data)
Download (USER KEY IS REQUIRED)
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Please send your questions and inquiries to
support@hremresearch.com
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