GPA for DigitalMicrograph

GPA generates fully quantitative deformation and strain maps from standard HREM images.
GPA is based on geometric phase algorithms originally developed by Martin Hytch

Flier/Specifications

Manual References and Technical Notes
  • M.J. Hytch, E. Snoeck and R. Kilaas, Ultramicroscopy 74 (1998) 131-146. Quantitative measurement of displacement and strain fields from HREM micrographs
  • C. L. Johnson, M. J. Hytch, P. R. Buseck, PNAS 101 (2004) 17936-17939. Nanoscale waviness of low-angle grain boundaries
  • M. J. Hytch, J-L. Putaux, J-M. Penisson, Nature 423 (2003) 270-273. Measurement of the displacement field around dislocations to 0.03A by electron microscopy
Examples (Sample Data)
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