Application Note:
FFT MULTISLICE APPROACH FOR STEM IMAGE SIMULATION (ICEM15, Durban, 2002)

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STEM
for MacHREMTM/ WinHREMTM

Scanning Transmission Electron Microscope
Image Simulation Program

Simulated HAADF image for GaAs [011]


This optional function adds the capability for simulating high-resolution scanning transmission electron microscope images to the MacHREMTM/WinHREMTM program suite. Using this program you can simulate bright-field images, dark-field images and high-angle annular dark-field (HAADF) images by using the FFT multislice technique on a personal computer.
  • User Friendly Graphical Interface
  • Even a novice user can easily generate his/her data and perform computation.
  • Reliable and Efficient Algorithm
  • Dynamical electron interaction is efficiently estimated by using the FFT multislice technique.
  • High Quality Image Output
  • All images are generated with a standard image format of Windows/Mac OS. Therefore, high quality images can be printed from them, and they can be imported into another application.


Please Contact to:
HREM Research Inc.
14-48 Matsukazedai, Higashimatsuyama, 355-0055 JAPAN
TEL/FAX 0493-35-3919
email: support@hremresearch.com
Reference: K. Ishizuka: A practical approach for STEM image simulation based on
the FFT multislice method, Ultramicroscopy 90 (2001) 71-83