March 01, 2011

QED for DigitalMicrograph


Higashimatsuyama, Saitama, Japan (March 01, 2011): HREM Research Inc. finally released QED (Quantitative Electron Diffraction) that was introduced at IMC17 in Rio, Brazil last year. QED allows you to collect quantitative electron diffraction from an aimed sample area down to a few nanometers.


QED is a patented procedure developed by Christoph Koch at the Max Planck-Institute for Metals Research, Stuttgart, Germany, to acquire LARBED (Large-Angle Rocking-Beam Electron Diffraction) and/or PED (Precession Electron Diffraction) patterns by controlling the tilt angle and position of a collimated electron beam. Compensating the beam shift induced by aberrations of the illumination system enables QED to collect electron diffraction data from nano-sized samples. LARBED data may be used to accurately determine the specimen thickness, the absolute values of structure factors, the crystal symmetry even of very thin (<10 nm) samples, as well as the specimen surface orientation.


"Without any change to his/her electron microscope, QED can acquire PED patterns, which are normally acquired by connecting dedicated external electronics to the deflection coils. Another advantage of controlling the electron beam by the QED software over existing PED hardware solutions is that the software automatically compensates the aberration-induced beam shift.h says Dr. Kazuo Ishizuka, President of HREM Research Inc. gMoreover, QED is a versatile tool to acquire novel kinds of electron diffraction data, unforeseen research fields will be opened up. We are therefore excited to providing QED to the electron microscope community."


About HREM Research Inc.

Founded in 2001, HREM Research Inc. specializes in developing products and services that enhance High-Resolution Electron Microscopy (HREM). Dr. Kazuo Ishizuka, the founder of a company has established the whole technique for HREM image simulation. Thus, a company's flagship product, xHREM, is a de facto standard of HR-(S)TEM image simulation software. Currently, HREM Research Inc. is actively working on making useful techniques to be available for the HREM community. For more information, visit or contact



Kazuo Ishizuka

HREM Research Inc.

14-48 Matsukazedai, Higashimatsuyama

355-0055 JAPAN


Supplementary materials

Individual diffraction discs (a and b) representing the 2-dimensional rocking curves for the selected reflection may be extracted from a LARBED data stack (c) recorded over an angular range of +/- 70 mrad by using the QED plug-in for Gatan DigitalMicrographTM.