April 28, 2016


sMoire for DigitalMicrograph


Higashimatsuyama, Saitama, Japan (April 28, 2016): HREM Research Inc. has announced that the STEM Moiré Analysis plug-in (sMoire) for DigitalMicrograph will be released on May 1, 2016.  The sMoire allows strain analysis to high accuracy from a single or a set of moiré images obtained by using STEM (Scanning Transmission Electron Microscope).


A Moiré pattern may be artificially generated in STEM by choosing the scan step (ds) close to the crystalline periodicity (d). The sMore measures fringe deformation from a single Moiré pattern using the technique developed for the GPA (Geometric Phase Analysis) for DigitalMicrograph. Furthermore, the sMore can calculate two dimensional strain maps using two geometric phases in a similar way to HoloDark (Dark-field Holography for strain) for DigitalMicrograph.


gWe have a series of strain measurement plug-ins for DigitalMicrograph (GPA, PPA and HoloDark),h says Dr. Kazuo Ishizuka, President of HREM Research Inc. gThe sMoire is the forth plug-in for strain measurement. Since atomic resolution STEM becomes increasingly popular these days because of ease of its operation, we believe the sMoire will become a major technique for strain measurement.h




About HREM Research Inc.

Founded in 2001, HREM Research Inc. specializes in developing products and services that enhance High-Resolution Electron Microscopy (HREM). Dr. Kazuo Ishizuka, the founder of a company has established the procedures for HREM image simulation. Thus, a company's flagship product, xHREM, is a de facto standard of HR-(S)TEM image simulation software. Currently, HREM Research Inc. is actively working on making useful techniques to be available for the HREM community. For more information, please visit or contact



Kazuo Ishizuka

HREM Research Inc.

14-48 Matsukazedai, Higashimatsuyama

355-0055 JAPAN



Supplementary materials

Strain map obtained from a STEM Moiré image. Artificial STEM moirés (dM) are created in a STEM by deliberately choosing a low magnification where the scan step (dS) is close to the crystalline periodicity (d).